[CentOS] Disk error (kicking from MD) during smartctl -t short

happymaster23 happymaster23 at gmail.com
Sun Nov 1 18:34:13 UTC 2009


Hello,

I started smartctl -t short of disk in RAID1, but during this
operation this disk was kicked from RAID (only from one MD of three).

/var/log/messages:
Nov  1 16:45:45 server kernel: ata1.00: exception Emask 0x0 SAct 0x0
SErr 0x0 action 0x0
Nov  1 16:45:45 server kernel: ata1.00: cmd
ea/00:00:00:00:00/00:00:00:00:00/a0 tag 0
Nov  1 16:45:45 server kernel:          res
51/04:00:38:df:f7/00:00:00:00:00/a7 Emask 0x1 (device error)
Nov  1 16:45:45 server kernel: ata1.00: status: { DRDY ERR }
Nov  1 16:45:45 serve kernel: ata1.00: error: { ABRT }
Nov  1 16:45:45 server kernel: ata1.00: configured for UDMA/133
Nov  1 16:45:45 server kernel: ata1: EH complete
Nov  1 16:45:45 server kernel: SCSI device sda: 625142448 512-byte
hdwr sectors (320073 MB)
Nov  1 16:45:45 server kernel: sda: Write Protect is off
Nov  1 16:45:45 server kernel: SCSI device sda: drive cache: write back
Nov  1 16:45:52 server kernel: ata1.00: exception Emask 0x0 SAct 0x0
SErr 0x0 action 0x0
Nov  1 16:45:52 server kernel: ata1.00: cmd
ea/00:00:00:00:00/00:00:00:00:00/a0 tag 0
Nov  1 16:45:52 server kernel:          res
51/04:00:38:df:f7/00:00:00:00:00/a7 Emask 0x1 (device error)
Nov  1 16:45:52 server kernel: ata1.00: status: { DRDY ERR }
Nov  1 16:45:52 server kernel: ata1.00: error: { ABRT }
Nov  1 16:45:52 server kernel: ata1.00: configured for UDMA/133
Nov  1 16:45:52 server kernel: ata1: EH complete
Nov  1 16:45:52 server kernel: SCSI device sda: 625142448 512-byte
hdwr sectors (320073 MB)
Nov  1 16:45:52 server kernel: sda: Write Protect is off
Nov  1 16:45:52 server kernel: SCSI device sda: drive cache: write back
Nov  1 16:47:43 server kernel: ata1.00: exception Emask 0x0 SAct 0x0
SErr 0x0 action 0x0
Nov  1 16:47:43 server kernel: ata1.00: BMDMA stat 0x25
Nov  1 16:47:43 server kernel: ata1.00: cmd
ca/00:08:1f:41:1e/00:00:00:00:00/e1 tag 0 dma 4096 out
Nov  1 16:47:43 server kernel:          res
51/10:08:1f:41:1e/00:00:00:00:00/e1 Emask 0x81 (invalid argument)
Nov  1 16:47:43 server kernel: ata1.00: status: { DRDY ERR }
Nov  1 16:47:43 server kernel: ata1.00: error: { IDNF }
Nov  1 16:47:43 server kernel: ata1.00: configured for UDMA/133
Nov  1 16:47:43 server kernel: sd 0:0:0:0: SCSI error: return code = 0x08000002
Nov  1 16:47:43 server kernel: sda: Current [descriptor]: sense key:
Aborted Command
Nov  1 16:47:43 server kernel:     Add. Sense: Recorded entity not found
Nov  1 16:47:43 server kernel:
Nov  1 16:47:44 server kernel: Descriptor sense data with sense
descriptors (in hex):
Nov  1 16:47:44 server kernel:         72 0b 14 00 00 00 00 0c 00 0a
80 00 00 00 00 00
Nov  1 16:47:44 server kernel:         01 1e 41 1f
Nov  1 16:47:44 server kernel: end_request: I/O error, dev sda, sector 18759967
Nov  1 16:47:44 server kernel: raid1: Disk failure on sda1, disabling device.
Nov  1 16:47:44 server kernel: Operation continuing on 1 devices
Nov  1 16:47:44 server kernel: ata1: EH complete
Nov  1 16:47:44 server kernel: SCSI device sda: 625142448 512-byte
hdwr sectors (320073 MB)
Nov  1 16:47:44 server kernel: sda: Write Protect is off
Nov  1 16:47:44 server kernel: SCSI device sda: drive cache: write back
Nov  1 16:47:44 server kernel: RAID1 conf printout:
Nov  1 16:47:44 server kernel:  --- wd:1 rd:2
Nov  1 16:47:44 server kernel:  disk 0, wo:1, o:0, dev:sda1
Nov  1 16:47:44 server kernel:  disk 1, wo:0, o:1, dev:sdb1
Nov  1 16:47:44 server kernel: RAID1 conf printout:
Nov  1 16:47:44 server kernel:  --- wd:1 rd:2
Nov  1 16:47:44 server kernel:  disk 1, wo:0, o:1, dev:sdb1

And output of smarctl -all:
=== START OF INFORMATION SECTION ===
Device Model:     WDC WD3201ABYS-01B9A0
Serial Number:
Firmware Version: 13.01C02
User Capacity:    320 072 933 376 bytes
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   8
ATA Standard is:  Exact ATA specification draft version not indicated
Local Time is:    Sun Nov  1 19:26:47 2009 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x84) Offline data collection activity
                                        was suspended by an
interrupting command from host.
                                        Auto Offline Data Collection: Enabled.
Self-test execution status:      (   0) The previous self-test routine completed
                                        without error or no self-test has ever
                                        been run.
Total time to complete Offline
data collection:                 (8400) seconds.
Offline data collection
capabilities:                    (0x7b) SMART execute Offline immediate.
                                        Auto Offline data collection
on/off support.
                                        Suspend Offline collection upon new
                                        command.
                                        Offline surface scan supported.
                                        Self-test supported.
                                        Conveyance Self-test supported.
                                        Selective Self-test supported.
SMART capabilities:            (0x0003) Saves SMART data before entering
                                        power-saving mode.
                                        Supports SMART auto save timer.
Error logging capability:        (0x01) Error logging supported.
                                        General Purpose Logging supported.
Short self-test routine
recommended polling time:        (   2) minutes.
Extended self-test routine
recommended polling time:        ( 100) minutes.
Conveyance self-test routine
recommended polling time:        (   5) minutes.
SCT capabilities:              (0x303f) SCT Status supported.
                                        SCT Feature Control supported.
                                        SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE
UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000f   200   200   051    Pre-fail
Always       -       0
  3 Spin_Up_Time            0x0003   156   156   021    Pre-fail
Always       -       5183
  4 Start_Stop_Count        0x0032   100   100   000    Old_age
Always       -       82
  5 Reallocated_Sector_Ct   0x0033   200   200   140    Pre-fail
Always       -       0
  7 Seek_Error_Rate         0x000e   200   200   000    Old_age
Always       -       0
  9 Power_On_Hours          0x0032   081   081   000    Old_age
Always       -       14329
 10 Spin_Retry_Count        0x0012   100   253   000    Old_age
Always       -       0
 11 Calibration_Retry_Count 0x0012   100   253   000    Old_age
Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age
Always       -       82
192 Power-Off_Retract_Count 0x0032   200   200   000    Old_age
Always       -       58
193 Load_Cycle_Count        0x0032   200   200   000    Old_age
Always       -       82
194 Temperature_Celsius     0x0022   123   106   000    Old_age
Always       -       24
196 Reallocated_Event_Count 0x0032   200   200   000    Old_age
Always       -       0
197 Current_Pending_Sector  0x0012   200   200   000    Old_age
Always       -       0
198 Offline_Uncorrectable   0x0010   200   200   000    Old_age
Offline      -       0
199 UDMA_CRC_Error_Count    0x003e   200   200   000    Old_age
Always       -       0
200 Multi_Zone_Error_Rate   0x0008   200   200   000    Old_age
Offline      -       0

SMART Error Log Version: 1
ATA Error Count: 5
        CR = Command Register [HEX]
        FR = Features Register [HEX]
        SC = Sector Count Register [HEX]
        SN = Sector Number Register [HEX]
        CL = Cylinder Low Register [HEX]
        CH = Cylinder High Register [HEX]
        DH = Device/Head Register [HEX]
        DC = Device Command Register [HEX]
        ER = Error register [HEX]
        ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 5 occurred at disk power-on lifetime: 14329 hours (597 days + 1 hours)
  When the command that caused the error occurred, the device was
doing SMART Offline or Self-test.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  10 51 08 a7 4a 1e e1  Error: IDNF at LBA = 0x011e4aa7 = 18762407

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  ca 00 08 a7 4a 1e e1 0a  45d+04:44:26.835  WRITE DMA
  ca 00 08 3f 14 00 e2 0a  45d+04:44:26.816  WRITE DMA

Error 4 occurred at disk power-on lifetime: 14326 hours (596 days + 22 hours)
  When the command that caused the error occurred, the device was
doing SMART Offline or Self-test.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  10 51 08 1f 41 1e e1  Error: IDNF at LBA = 0x011e411f = 18759967

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  ca 00 08 1f 41 1e e1 0a  45d+02:30:44.518  WRITE DMA
  ca 00 08 3f 14 00 e2 0a  45d+02:30:44.504  WRITE DMA

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining
LifeTime(hours)  LBA_of_first_error
# 1  Short offline       Completed without error       00%     14329         -
# 2  Short offline       Completed without error       00%     14329         -
# 3  Extended offline    Completed without error       00%     14328         -
# 4  Short offline       Completed without error       00%     14326         -

SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.


This device was kicked from MD during #4 and #2 short test. Second HDD
(same as this problematic) is without errors.

Thank you for you help


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