[CentOS] smartctl: is my disc dying?

Mon Jan 27 08:11:21 UTC 2014
Bob Hepple <bob.hepple at gmail.com>

I've got a 1Tb USB disc that appears to be dying - eg it took about 10 days
(!) to run 'badblocks -nsv /dev/sdc' and it only did less than 2% in that
time. Read access became _really_ slow.

So there's definitely something amiss and I've got it offline.

There's no drama about the content as I have other backups and I'm resigned
to junking the thing, but I'm curious about the fact that smartctl doesn't
seem to report any errors. I tried a short and a long test but nothing in
there seems to be alarming - in fact it says PASSED!! - but the output is
pretty opaque and maybe I've been foxed by ambiguity. Anyone care to comment
on it?

Here it is:

[root at nina bhepple]# smartctl /dev/sdc -a
smartctl 5.43 2012-06-30 r3573 [i686-linux-2.6.32-358.23.2.el6.i686] (local
build)
Copyright (C) 2002-12 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Model Family:     Western Digital Caviar Green
Device Model:     WDC WD10EAVS-00M4B0
Serial Number:    WD-WCAV5A574187
LU WWN Device Id: 5 0014ee 2aef3c352
Firmware Version: 01.00A01
User Capacity:    1,000,204,886,016 bytes [1.00 TB]
Sector Size:      512 bytes logical/physical
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   8
ATA Standard is:  Exact ATA specification draft version not indicated
Local Time is:    Mon Jan 27 17:43:33 2014 EST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x84) Offline data collection activity
                                        was suspended by an interrupting
command from host.
                                        Auto Offline Data Collection: Enabled.
Self-test execution status:      (   0) The previous self-test routine completed
                                        without error or no self-test has ever 
                                        been run.
Total time to complete Offline 
data collection:                (18780) seconds.
Offline data collection
capabilities:                    (0x7b) SMART execute Offline immediate.
                                        Auto Offline data collection on/off
support.
                                        Suspend Offline collection upon new
                                        command.
                                        Offline surface scan supported.
                                        Self-test supported.
                                        Conveyance Self-test supported.
                                        Selective Self-test supported.
SMART capabilities:            (0x0003) Saves SMART data before entering
                                        power-saving mode.
                                        Supports SMART auto save timer.
Error logging capability:        (0x01) Error logging supported.
                                        General Purpose Logging supported.
Short self-test routine 
recommended polling time:        (   2) minutes.
Extended self-test routine
recommended polling time:        ( 217) minutes.
Conveyance self-test routine
recommended polling time:        (   5) minutes.
SCT capabilities:              (0x3037) SCT Status supported.
                                        SCT Feature Control supported.
                                        SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED 
WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x002f   200   200   051    Pre-fail  Always   
   -       0
  3 Spin_Up_Time            0x0027   114   107   021    Pre-fail  Always   
   -       7283
  4 Start_Stop_Count        0x0032   091   091   000    Old_age   Always   
   -       9764
  5 Reallocated_Sector_Ct   0x0033   200   200   140    Pre-fail  Always   
   -       0
  7 Seek_Error_Rate         0x002e   200   200   000    Old_age   Always   
   -       0
  9 Power_On_Hours          0x0032   080   080   000    Old_age   Always   
   -       14907
 10 Spin_Retry_Count        0x0032   100   100   000    Old_age   Always   
   -       0
 11 Calibration_Retry_Count 0x0032   100   100   000    Old_age   Always   
   -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always   
   -       181
192 Power-Off_Retract_Count 0x0032   200   200   000    Old_age   Always   
   -       82
193 Load_Cycle_Count        0x0032   186   186   000    Old_age   Always   
   -       44531
194 Temperature_Celsius     0x0022   098   083   000    Old_age   Always   
   -       49
196 Reallocated_Event_Count 0x0032   200   200   000    Old_age   Always   
   -       0
197 Current_Pending_Sector  0x0032   192   192   000    Old_age   Always   
   -       1423
198 Offline_Uncorrectable   0x0030   196   196   000    Old_age   Offline  
   -       700
199 UDMA_CRC_Error_Count    0x0032   200   200   000    Old_age   Always   
   -       0
200 Multi_Zone_Error_Rate   0x0008   001   001   000    Old_age   Offline  
   -       793265

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)
 LBA_of_first_error
# 1  Extended offline    Completed: read failure       90%     14545       
 1141581559
# 2  Short offline       Completed: read failure       90%     14545       
 1141577005

SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.